M1m Microelectronic AOI

  1. M1SeriesNYTB

The M1m high speed chip level inspection.

 

Download the M1m datasheet.

The M1m offers high-speed microelectronic device inspection with exceptional defect coverage. With 5 micron pixel resolution and telecentric optics, M1SeriesNYTBthe M1m provides complete inspection, all within a footprint less than 1 sq. meter.

Automated Optical Inspection for Microelectronics

  • Megapixel color imaging
  • High magnification
    top-down viewing camera
  • Quick set-up
  • High speed
  • High defect coverage
  • Low false failure rate

Nordson YESTECH’s advanced megapixel technology offers high-speed PCB inspection with exceptional defect coverage. With high resolution and telecentric optics, M1 Series inspects solder joints and verifies correct part assembly, all within a footprint less than 1 meter wide, enabling users to improve quality and increase throughput.

Programming the M1 Series is fast and intuitive. Operators typically take less than 30 minutes to create a complete inspection program including solder inspection. The M1 Series utilizes a standard package library to simplify training and insure program portability across manufacturing lines.

Newly available image processing technology integrates several techniques, including color, normalized correlation and rule-based algorithms, to provide complete inspection coverage with an extremely low false failure rate.

Configurable for all line positions, the M1 Series is equally effective for paste, pre / post-reflow or final assembly inspection. Off-line programming maximizes machine utilization and real-time SPC monitoring provides a valuable yield enhancement solution.